Technology
AI fingerprint authentication algorithm
AIL is committed to creating innovative value and building a sustainable future.

Preventing Fingerprint Recognition Errors Caused by Fingerprint Ridge Distortion
- Unlike smartphones, thin card devices are more susceptible to bending when the fingerprint sensor is pressed firmly with a finger.
This bending causes fingerprint ridge distortions, leading to recognition errors. - Our Validation Engine Technology detects excessive deviation in fingerprint ridge patterns.
If the deviation exceeds a certain threshold, the system compares the fingerprint data with registered training data,
ensuring only valid fingerprint information progresses to the next step.


fingerprints on smartphones

on cards

Technology
AI fingerprint authentication algorithm
AIL is committed to creating innovative value and building a sustainable future.

Preventing Fingerprint Recognition Errors Caused by Fingerprint Ridge Distortion
- Unlike smartphones, thin card devices are more susceptible to bending when the fingerprint sensor is pressed firmly with a finger.
This bending causes fingerprint ridge distortions, leading to recognition errors. - Our Validation Engine Technology detects excessive deviation in fingerprint ridge patterns.
If the deviation exceeds a certain threshold, the system compares the fingerprint data with registered training data,
ensuring only valid fingerprint information progresses to the next step.






AI-Based Biometric Authentication Algorithm for Preventing Errors Due to Metal Materials
- When using a metal fingerprint card for payment, a slight capacitive charge may form between the human hand and the metal plate, potentially causing malfunction during fingerprint authentication.
- To resolve this issue, we have integrated a Capacitance Detection Algorithm into our AI biometric authentication system. The fingerprint sensor is only activated (Wake-Up) when a capacitance change exceeding a certain threshold is detected, effectively preventing malfunction caused by unintended capacitive changes.
